SRS station 16.3: high-resolution applications

B M  Murphy; S P  Collins; M  Golshan; M  Moore; J  Reid; G  Kowalski

SRS station 16.3: high-resolution applications

B M Murphy, S P Collins, M Golshan, M Moore, J Reid, G Kowalski

Research output: Contribution to journal › Article

Abstract

Station 16.3 is a high-resolution X-ray diffraction beamline at Daresbury Laboratory Synchrotron Radiation Source. The data presented demonstrate the high-resolution available on the station utilising the recently commissioned four-reflection Si 1 1 1 monochromator and three-reflection Si 1 1 1 analyser. For comparison, a reciprocal space map of the two-bounce Si 1 1 1 monochromator and two-bounce analyser is also shown. Operation of the station is illustrated with examples for silicon. and for diamond. Lattice parameter variations were measured with accuracies in the part per million range and lattice tilts at the are second level (DuMond. Phys. Rev. 52 (1937) 872). (C) 2001 Elsevier Science B.V. All rights reserved.

Original language	English
Pages (from-to)	1014-1018
Number of pages	5
Journal	Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	467
Issue number	2
Publication status	Published - 21 Jul 2001

Keywords

synchrotron radiation
high-resolution X-ray diffraction
reciprocal space map
diamond
diffraction facility

Cite this

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title = "SRS station 16.3: high-resolution applications",

abstract = "Station 16.3 is a high-resolution X-ray diffraction beamline at Daresbury Laboratory Synchrotron Radiation Source. The data presented demonstrate the high-resolution available on the station utilising the recently commissioned four-reflection Si 1 1 1 monochromator and three-reflection Si 1 1 1 analyser. For comparison, a reciprocal space map of the two-bounce Si 1 1 1 monochromator and two-bounce analyser is also shown. Operation of the station is illustrated with examples for silicon. and for diamond. Lattice parameter variations were measured with accuracies in the part per million range and lattice tilts at the are second level (DuMond. Phys. Rev. 52 (1937) 872). (C) 2001 Elsevier Science B.V. All rights reserved.",

keywords = "synchrotron radiation, high-resolution X-ray diffraction, reciprocal space map, diamond, diffraction facility",

author = "Murphy, {B M} and Collins, {S P} and M Golshan and M Moore and J Reid and G Kowalski",

year = "2001",

month = jul,

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language = "English",

volume = "467",

pages = "1014--1018",

journal = "Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment",

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TY - JOUR

T1 - SRS station 16.3: high-resolution applications

AU - Murphy, B M

AU - Collins, S P

AU - Golshan, M

AU - Moore, M

AU - Reid, J

AU - Kowalski, G

PY - 2001/7/21

Y1 - 2001/7/21

N2 - Station 16.3 is a high-resolution X-ray diffraction beamline at Daresbury Laboratory Synchrotron Radiation Source. The data presented demonstrate the high-resolution available on the station utilising the recently commissioned four-reflection Si 1 1 1 monochromator and three-reflection Si 1 1 1 analyser. For comparison, a reciprocal space map of the two-bounce Si 1 1 1 monochromator and two-bounce analyser is also shown. Operation of the station is illustrated with examples for silicon. and for diamond. Lattice parameter variations were measured with accuracies in the part per million range and lattice tilts at the are second level (DuMond. Phys. Rev. 52 (1937) 872). (C) 2001 Elsevier Science B.V. All rights reserved.

AB - Station 16.3 is a high-resolution X-ray diffraction beamline at Daresbury Laboratory Synchrotron Radiation Source. The data presented demonstrate the high-resolution available on the station utilising the recently commissioned four-reflection Si 1 1 1 monochromator and three-reflection Si 1 1 1 analyser. For comparison, a reciprocal space map of the two-bounce Si 1 1 1 monochromator and two-bounce analyser is also shown. Operation of the station is illustrated with examples for silicon. and for diamond. Lattice parameter variations were measured with accuracies in the part per million range and lattice tilts at the are second level (DuMond. Phys. Rev. 52 (1937) 872). (C) 2001 Elsevier Science B.V. All rights reserved.

KW - synchrotron radiation

KW - high-resolution X-ray diffraction

KW - reciprocal space map

KW - diamond

KW - diffraction facility

M3 - Article

SN - 0168-9002

VL - 467

SP - 1014

EP - 1018

JO - Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment

IS - 2

ER -

SRS station 16.3: high-resolution applications

Abstract

Keywords

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