A low-order IRC-based scheme for resonance damping and tracking control for Atomic Force Microscopy

A J Fleming, S S Aphale, S O R Moheimani

Research output: Chapter in Book/Report/Conference proceeding › Published conference contribution

Original language	English
Title of host publication	Proceedings of the American Control Conference, Invited Session on Nanopositioning and AFM Applications, Seattle, WA, USA
Publication status	Published - 2009

Cite this

A low-order IRC-based scheme for resonance damping and tracking control for Atomic Force Microscopy. / Fleming, A J; Aphale, S S; Moheimani, S O R.
Proceedings of the American Control Conference, Invited Session on Nanopositioning and AFM Applications, Seattle, WA, USA. 2009.

Research output: Chapter in Book/Report/Conference proceeding › Published conference contribution

@inproceedings{2d5190e76d0f4623aff877bd18043727,

title = "A low-order IRC-based scheme for resonance damping and tracking control for Atomic Force Microscopy",

author = "Fleming, {A J} and Aphale, {S S} and Moheimani, {S O R}",

year = "2009",

language = "English",

booktitle = "Proceedings of the American Control Conference, Invited Session on Nanopositioning and AFM Applications, Seattle, WA, USA",

}