A low-order IRC-based scheme for resonance damping and tracking control for Atomic Force Microscopy

A J Fleming, S S Aphale, S O R Moheimani

Research output: Chapter in Book/Report/Conference proceedingPublished conference contribution

Original languageEnglish
Title of host publicationProceedings of the American Control Conference, Invited Session on Nanopositioning and AFM Applications, Seattle, WA, USA
Publication statusPublished - 2009

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