A novel X-ray diffractometer to study the texture of materials

C. C. Tang*, M. C. Miller, S. M. Clark, M. A. Player, G. R.G. Craib

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminium sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.

Original languageEnglish
Pages (from-to)6-13
Number of pages8
JournalJournal of synchrotron radiation
Issue number1
Publication statusPublished - 1996


  • Aluminium drawn wire
  • Erbium thin film
  • Real-time data acquisition
  • Texture analysis
  • X-ray energy-dispersive technique


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