A novel X-ray diffractometer to study the texture of materials

C. C. Tang; M. C. Miller; S. M. Clark; M. A. Player; G. R.G. Craib

doi:10.1107/S090904959501404X

A novel X-ray diffractometer to study the texture of materials

C. C. Tang^*, M. C. Miller, S. M. Clark, M. A. Player, G. R.G. Craib

^*Corresponding author for this work

Daresbury Laboratory

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminium sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.

Original language	English
Pages (from-to)	6-13
Number of pages	8
Journal	Journal of synchrotron radiation
Volume	3
Issue number	1
DOIs	https://doi.org/10.1107/S090904959501404X
Publication status	Published - 1996

Keywords

Aluminium drawn wire
Erbium thin film
Real-time data acquisition
Texture analysis
X-ray energy-dispersive technique

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10.1107/S090904959501404XLicence: Unspecified

Cite this

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KW - Erbium thin film

KW - Real-time data acquisition

KW - Texture analysis

KW - X-ray energy-dispersive technique

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A novel X-ray diffractometer to study the texture of materials

Abstract

Keywords

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