The optical properties of thin erbium films

N. Öncan; L. Ward; M. A. Player

doi:10.1016/0030-3992(94)90124-4

The optical properties of thin erbium films

N. Öncan^*, L. Ward, M. A. Player

^*Corresponding author for this work

Engineering

Coventry University

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The effective dielectric constant, ε′₂, of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. ε′₂ showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.

Original language	English
Pages (from-to)	361-364
Number of pages	4
Journal	Optics and Laser Technology
Volume	26
Issue number	5
DOIs	https://doi.org/10.1016/0030-3992(94)90124-4
Publication status	Published - 1994

Keywords

dielectric constant
erbium
optical properties
thin films

Access to Document

10.1016/0030-3992(94)90124-4Licence: Unspecified

Cite this

@article{28360ba202cb4dac9b8c0d003dd2a0b6,

title = "The optical properties of thin erbium films",

abstract = "The effective dielectric constant, ε′2, of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. ε′2 showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.",

keywords = "dielectric constant, erbium, optical properties, thin films",

author = "N. {\"O}ncan and L. Ward and Player, {M. A.}",

year = "1994",

doi = "10.1016/0030-3992(94)90124-4",

language = "English",

volume = "26",

pages = "361--364",

journal = "Optics and Laser Technology",

issn = "0030-3992",

publisher = "Elsevier Ltd",

number = "5",

}

TY - JOUR

T1 - The optical properties of thin erbium films

AU - Öncan, N.

AU - Ward, L.

AU - Player, M. A.

PY - 1994

Y1 - 1994

N2 - The effective dielectric constant, ε′2, of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. ε′2 showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.

AB - The effective dielectric constant, ε′2, of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. ε′2 showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.

KW - dielectric constant

KW - erbium

KW - optical properties

KW - thin films

UR - http://www.scopus.com/inward/record.url?scp=0028517904&partnerID=8YFLogxK

U2 - 10.1016/0030-3992(94)90124-4

DO - 10.1016/0030-3992(94)90124-4

M3 - Article

AN - SCOPUS:0028517904

SN - 0030-3992

VL - 26

SP - 361

EP - 364

JO - Optics and Laser Technology

JF - Optics and Laser Technology

IS - 5

ER -

The optical properties of thin erbium films

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this