Abstract
The possibility of circumventing the difficulties of fine doping control in GaN Gunn diode devices by the substitution of a fully depleted p-type doping spike for the doping notch used to promote domain formation is explored using a Monte Carlo model. The p-type doping spike is a commonly used structure, but its potential use in GaN has not been previously evaluated. The results for a functional doping spike are compared, favorably, to those for a physically reasonable doping notch. (C) 2008 American Institute of Physics.
Original language | English |
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Article number | 062103 |
Number of pages | 2 |
Journal | Applied Physics Letters |
Volume | 93 |
Issue number | 6 |
DOIs | |
Publication status | Published - 11 Aug 2008 |
Keywords
- microwave-power generation
- Monte-Carlo analysis
- devices
- performance
- substrate
- transport