Skip to main navigation
Skip to search
Skip to main content
The University of Aberdeen Research Portal Home
Help & FAQ
Home
Profiles
Disciplines
Research output
Research Facilities
Datasets
Impacts
Activities
Press/Media
Prizes
Projects
Search by expertise, name or affiliation
Evolution of a Surface-Roughness Spectrum Caused by Stress in Nanometer-Scale Chemical Etching
K.-S. Kim, J. A. Hurtado,
H. Tan
Engineering
Brown University
Research output
:
Contribution to journal
›
Article
›
peer-review
80
Citations (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Evolution of a Surface-Roughness Spectrum Caused by Stress in Nanometer-Scale Chemical Etching'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Physics & Astronomy
surface roughness
100%
roughness
97%
etching
89%
microscopes
45%
aluminum
40%
ceramics
39%
decay
33%
metals
30%